发明名称 Leakage-tolerant memory arrangements
摘要 The present invention is in the area of memory architecture. More particularly, the present invention provides a method, apparatus, machine-readable medium, and system reduce leakage current in memory. Embodiments may take advantage of the reverse bias characteristic of circuit elements, such as the reverse gate-to-source bias characteristic of a transistor, within the memory to limit leakage and provide for a leakage tolerant data storage technique. Embodiments may also enable the reverse bias characteristic of circuit elements, such as the reverse gate-to-source bias characteristic of a transistor, to be taken advantage of by sourcing charge from data storage elements.
申请公布号 US2003063511(A1) 申请公布日期 2003.04.03
申请号 US20010966193 申请日期 2001.09.28
申请人 HSU STEVEN K.;KRISHNAMURTHY RAM 发明人 HSU STEVEN K.;KRISHNAMURTHY RAM
分类号 G11C7/12;G11C11/419;(IPC1-7):G11C7/00 主分类号 G11C7/12
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