APPARATUS FOR MEASURING PLATED AREA

摘要

PROBLEM TO BE SOLVED: To provide an apparatus for measuring a plated area which extracts an exact plated area from a monochromatic screen without expansion and contraction processing and the determination of thresholds for binarization by measurer. SOLUTION: This apparatus for measuring the plated area is provided with diffused light sources composed of monochromatic light and facingly arranged for illuminating a lead frame, a background means arranged on the opposite side of the diffused light sources with respect to the lead frame and having a reflectance near the spectral reflectance of the lead frame, and detection means for detecting a light reflected from the lead frame through illumination from the diffused light sources. The plated area is extracted based on luminance distribution which is extracted by the detection means.