发明名称 METHOD AND CIRCUIT FOR CHECKING PATTERN DATA
摘要 PROBLEM TO BE SOLVED: To check whether a test pattern is transferred normally or not, when a pattern data written in a device program is transferred to a pattern memory. SOLUTION: This pattern data checking circuit for checking whether the pattern data is transferred normally or not, when the pattern data used by execution of the device program is transferred to the pattern memory 14 stored with the pattern data, and when a parity pattern data provided by conducting preliminarily a parity operation to a value of the pattern data is transferred to a parity pattern memory 17 to which the pattern data is stored, by a CPU 12 respectively, has a parity computing circuit 31 for conducting the parity operation for the pattern data transferred to the pattern memory 14 by the CPU 12, and an inconsistency detecting circuit 32 for detecting inconsistency between a parity computation result by the parity computing circuit 31 and the transmitted parity pattern data.
申请公布号 JP2003098238(A) 申请公布日期 2003.04.03
申请号 JP20010294389 申请日期 2001.09.26
申请人 ANDO ELECTRIC CO LTD 发明人 MATSUMOTO TOSHIHIKO
分类号 G01R31/3183;G06F11/10;G06F11/22 主分类号 G01R31/3183
代理机构 代理人
主权项
地址