发明名称 FINE PARTICLE ADHESIVE FORCE MEASURING APPARATUS AND ADHESIVE FORCE MEASURING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To provide a fine particle adhesive force measuring method and a measuring apparatus capable of making measurement in various environments and measuring even for the charged particles as in an electrophotographic toner, particularly, to provide a fine particle adhesive force measuring method for measuring the adhesive force between a developer toner and a carrier used for electrophotography, enabling an accurate estimation of electrostatic force acting during the adhesive force measurement by carrying out the measurement under uniform electric field. SOLUTION: In the fine particle adhesive force measuring method, particles obtained from a mixture of at least one type of magnetic particles and no less than one type of particles are made to adhere to a measured object carrier having a measured object carrying surface in a uniform plane, by moving the carrier in high speed vertically with respect to the carrying surface while applying a certain electric field to the particles, the particles are detached from the magnetic particles, and the particle adhesive force is measured by obtaining the numbers of the particles before and after the detachment and the masses of the particles.</p>
申请公布号 JP2003098065(A) 申请公布日期 2003.04.03
申请号 JP20010290308 申请日期 2001.09.25
申请人 RICOH CO LTD 发明人 KOBAN AKIHIRO;KATO KOICHI;WATANABE KAZUTO
分类号 G01N19/04;G03G9/08;G03G9/10;G03G21/00;(IPC1-7):G01N19/04 主分类号 G01N19/04
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