发明名称 Method of producing semiconductor device and its structure
摘要 A method of producing a semiconductor device having an SOI transistor and a multi-layer wiring, including: preparing a silicon substrate having a front face and a back face; forming an inter-layer insulation layer on the front face of the silicon substrate; forming a multi-layer wiring in the inter-layer insulation layer; fixing a substrate on the inter-layer insulation layer; thinning the silicon substrate from the back face into a thin film so that the silicon substrate becomes an SOI layer; and forming a channel layer and a gate electrode on a back of the channel layer in the SOI layer, and further forming a source and a drain facing each other having the channel layer in between so that an SOI transistor is obtained.
申请公布号 US2003064553(A1) 申请公布日期 2003.04.03
申请号 US20020255619 申请日期 2002.09.27
申请人 OASHI TOSHIYUKI 发明人 OASHI TOSHIYUKI
分类号 H01L21/28;H01L21/02;H01L21/3205;H01L21/336;H01L21/8234;H01L21/84;H01L23/52;H01L27/08;H01L27/088;H01L27/12;H01L29/417;H01L29/786;(IPC1-7):H01L21/336 主分类号 H01L21/28
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