| 摘要 |
In the present invention, the temperature of a bypass diode of a solar cell module is measured by a temperature detection means from the exterior of the solar cell module, and the results of temperature detection on each bypass diode are mutually compared to detect the presence or absence of the failure in the solar cell module. Also at least one solar cell in the solar cell module is covered with a light shielding plate, then a current flowing in the bypass diode bypassing to the covered solar cell is detected, and a failed solar cell module is detected from the result of the current detection. Also the solar cell module is provided with a temperature detection means capable of detecting the temperature of the bypass diode and the temperature of an internal portion of the solar cell module other than the bypass diode. By these, it is rendered possible to detect a failure in the solar cell module easily and exactly, and also to detect the short circuit failure in the solar cell.
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