发明名称 Improvements in or relating to devices for the x-ray analysis of materials
摘要 816,464. X-ray analysis. PHILIPS ELECTRICAL INDUSTRIES Ltd. Aug. 6, 1957 [Aug. 9, 1956], No. 24743/57. Class 40 (3). In the analysis of a material or the measurement of the thickness of, for example, a zinc coating 2 on an iron or steel base 1, fluorescent radiation from a copper block 3 falls on the coating 2 and base 1 and the radiation from the base 1 is measured by a proportional counter 5 connected to a linear amplifier 6, a pulseintensity discriminator 7 and a counting-device 8. The radiation from the block 3 is produced by X-rays from a tube 4. A cobalt filter 9 may be arranged in front of the proportional counter 5.
申请公布号 GB816464(A) 申请公布日期 1959.07.15
申请号 GB19570024743 申请日期 1957.08.06
申请人 PHILIPS ELECTRICAL INDUSTRIES LIMITED 发明人
分类号 G01N23/223 主分类号 G01N23/223
代理机构 代理人
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