| 摘要 |
PROBLEM TO BE SOLVED: To solve the problem of difficulty of selecting a specified functional block to be measured in a desired measuring state and measuring a power supply current value, in the case of measuring with an LSI tester a power supply current value of a specified functional block of a semiconductor integrated circuit where a functional block group performs an interrelated complex operation. SOLUTION: A measurement trigger signal generating circuit 204 is provided to output a measuring trigger signal 209 for informing an LSI tester 206 on a measuring timing, and an operation select circuit 210 is provided to select the operation for the case of containing a specified functional block to be measured and the case of not containing it, whereby the LSI tester 206 detects a measuring trigger signal 209, and measures a power supply current in timing when the semiconductor integrated circuit 201 performs the operation to be measured, and further a power supply current value in different operation is measured to take a difference between them to measure an accurate power supply current value of a specified functional block.
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