Testing simulated chips,申请号EP20010303720-传众专利搜索

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发明名称	Testing simulated chips
摘要
申请公布号	EP1150224(A3)	申请公布日期	2003.04.02
申请号	EP20010303720	申请日期	2001.04.24
申请人	HEWLETT-PACKARD COMPANY	发明人	JUE, DARREN S.;GUPTA, ASHISH
分类号	G01R31/28;G06F17/50;(IPC1-7):G06F17/50	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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