发明名称 |
AN APPARATUS AND METHOD FOR INVESTIGATING A SAMPLE |
摘要 |
An apparatus and method for investigating a sample, the apparatus comprising: means (61) for irradiating the sample (21) with a first beam of electromagnetic radiation configured to excite an optically non-linear process within the sample; means (61) for irradiating the sample with a second beam of electromagnetic radiation; and a detector (41) for detecting a change the second beam after it has been reflected from or transmitted through the sample. If the optically non-linear process is a second order process, the detector could be used to detect a change in the polarisation of the second beam. Apparatus and method find application of samples with terahertz (THZ) radiation locally generated and detected within the sample. |
申请公布号 |
EP1297321(A1) |
申请公布日期 |
2003.04.02 |
申请号 |
EP20010909967 |
申请日期 |
2001.02.28 |
申请人 |
TERAVIEW LIMITED |
发明人 |
ARNONE, DONALD DOMINIC;CIESLA, CRAIG MICHAEL;COLE, BRYAN EDWARD |
分类号 |
G01N21/35;G01N21/63;(IPC1-7):G01N21/35;G01N22/00 |
主分类号 |
G01N21/35 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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