Device and method for the determination of the quality of structured surfaces

摘要

The present invention relates to a device for a quantified determination of the quality of structured surfaces comprising a first optical device that emits light at a predetermined angle onto the surface to be measured and a second optical device having at least one photo sensor which receives the light reflected by the measurement surface. The optical device are configured such that the reflected light is influenced by the structure of the measurement surface and the reflected light is evaluated by an evaluator, which is provided for controlling the measurement sequence and which comprises a processor and a controller where at least one structural variable is derived therefrom which is characteristic of at least one structural-contingent property of the surface.