发明名称 Precision metal locating apparatus
摘要 Apparatus for detecting a metal object comprises a transmitter for generating a pulsed or an alternating magnetic field in the vicinity of the metal object to be detected and a detector for detecting the secondary magnetic field induced in the metal object by the transmitted magnetic field. The detector measures at least three magnetic field gradient components of at least first order of the secondary magnetic field. The apparatus also comprises a processor for determining at least one of the position or the electro-magnetic cross-section or an estimate of the shape of the metal object from the measured magnetic field spatial gradient components. The processor fits the measured components to dipole, multiple dipole, multipole, or extended source models. In a preferred embodiment, the invention may comprise three or more pairs of gradiometric coils, or other sensing means. The detector measures at least five magnetic field gradient components of at least first order, and one or more components of the secondary magnetic field. The detector may be coils, or any other magnetic sensors. The processor enters pre-determined criteria to discriminate against detection of metal objects of no interest or to selectively detect metal objects of interest.
申请公布号 US6541966(B1) 申请公布日期 2003.04.01
申请号 US20000719419 申请日期 2000.12.12
申请人 QINETIQ LIMITED 发明人 KEENE MARK N
分类号 G01V3/10;G01V3/08;(IPC1-7):G01V3/08;A61B5/06;G01V3/165 主分类号 G01V3/10
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