发明名称 Semiconductor device including a plurality of interconnection layers, manufacturing method thereof and method of designing semiconductor circuit used in the manufacturing method
摘要 A semiconductor device including an interconnection structure having superior electrical characteristics and allowing higher speed of operation and lower power consumption even when miniaturized, manufacturing method thereof and a method of designing a semiconductor circuit used in the manufacturing method are provided. In the semiconductor device, a conductive region is formed on a main surface of a semiconductor substrate. A first interconnection layer is electrically connected to the conductive region, has a relatively short line length, and contains a material having relatively high electrical resistance. A first insulator is formed to surround the first interconnection layer and has a relatively low dielectric constant. A second interconnection layer is formed on the main surface of the semiconductor substrate, contains a material having low electrical resistance than the material contained in the first interconnection layer, and has longer line length than the first interconnection layer. A second insulator is formed to surround the second interconnection layer and has a dielectric constant higher than the first insulator.
申请公布号 US6541862(B2) 申请公布日期 2003.04.01
申请号 US20010907675 申请日期 2001.07.19
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 AMISHIRO HIROYUKI;IGARASHI MOTOSHIGE
分类号 H01L21/768;H01L21/8238;H01L23/522;H01L23/528;H01L27/092;(IPC1-7):H01L23/48 主分类号 H01L21/768
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