MEMORY INSPECTING CIRCUIT

摘要

PROBLEM TO BE SOLVED: To test a memory while suppressing increment of circuit scale. SOLUTION: This circuit has a test signal generating section 14 generating a test signal by combination of signal lines being less than the number of data input lines of a memory 16 to be tested, a path selecting section 15 is set so that a test signal from the test signal generating section 14 is supplied to the memory 16 to be inspected, a plurality of test signals are outputted by path selection of the path selecting section 15 and a plurality of tests are performed with simple constitution.