发明名称 SUBSTRATE INSPECTION SYSTEM
摘要 PROBLEM TO BE SOLVED: To improve the reliability of the defect classification. SOLUTION: A PC 16 for image display to display a defect selective window Wa comprising the image of a result image file which is an inspection result by an automatic macro inspection and the information of the inspection result of a defective part of a labeling '3' stored in an inspection result file 13, for example, defect classification and defect name is provided adjacent to a manual macro inspection device 8, and the actual manual macro inspection result is comparatively observed while referring to the automatic macro inspection result. If the automatic macro inspection results such as the classification of the defective parts and the defect names are different from the manual macro inspection result, the classification of the defective parts and the defect names are corrected in the defect selection window Wa and are temporarily registered.
申请公布号 JP2003090802(A) 申请公布日期 2003.03.28
申请号 JP20010283764 申请日期 2001.09.18
申请人 OLYMPUS OPTICAL CO LTD 发明人 TAKAHASHI TAKEHIRO
分类号 G01N21/956;G01M11/00;G06T1/00;H01L21/66;H04N7/18 主分类号 G01N21/956
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