| 摘要 |
PROBLEM TO BE SOLVED: To provide an appearance inspection method for chip parts capable of performing accurate appearance inspection by surely receiving reflection light from a ridge part. SOLUTION: The method for inspection of the appearance of chip parts (1) includes irradiating two surfaces (1c and 1d) positioning with an ridge part (1b) of the chip in between, and photographing the reflection light beam (5) reflected from the ridge part, with a camera (2) arranged facing the ridge part. |
