Memory chip and apparatus for testing a memory chip

摘要

The present invention provides a memory chip (100) which can be operated in a normal mode and in a test mode (TM) and which has a device (102) for outputting data from the memory chip (100) and a device (104) for enabling the device (102) for outputting data when the test mode (TM) has been activated. The device (104) for enabling the device (102) for outputting data has a device for masking data so that only particular portions of the data are output when a data masking state (DQM) has been activated.