发明名称 CMP pad having isolated pockets of continuous porosity and a method for using such pad
摘要 A chemical mechanical polishing pad and a system and a method for using such a pad are described. The polishing pad includes pockets of continuous porosity, each of the pockets being separated from the other pockets by a non-porous matrix. The non-porous matrix may include a network of trenches, or may have pores which have been filled with a material. The material may include a polymer resin. A system for polishing a wafer includes the polishing pad mounted on a platen. A drive assembly creates relative rotation between the wafer and the polishing pad through a drive shaft. The drive shaft may be connected to the platen or it may be connected to a wafer holder which holds the wafer. Alternatively, one drive shaft may be connected to the platen and another drive shaft may be connected to the wafer holder, and a pair of drive assemblies drive the drive shafts.
申请公布号 US2003060151(A1) 申请公布日期 2003.03.27
申请号 US20020202828 申请日期 2002.07.26
申请人 KRAMER STEVE 发明人 KRAMER STEVE
分类号 B24B37/04;(IPC1-7):B24D11/00 主分类号 B24B37/04
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