| 摘要 |
A high-performance microscope allows total internal reflection fluorescence microscopy, fluorescence microscopy and interference reflection microscopy (or reflection contrast microscopy) to be selectively performed by using the same objective. The microscope has an objective optical system and an image-forming optical system for imaging light from a sample passing through the objective optical system onto an image pickup device. An optical member is provided in a viewing optical path extending from the objective optical system to the image-forming optical system. The optical member reflects illuminating light from an illuminating optical system so that the illuminating light enters the objective optical system, and allows the light from the sample passing through the objective optical system to pass through the image-forming optical system. The illuminating optical system is provided therein with a mechanism for adjusting an illuminating light collecting position on a pupil plane of the objective optical system in a direction perpendicular to an optical axis. The viewing optical path is provided therein with a wavelength selecting device for selecting an observation wavelength according to the illuminating light collecting position on the pupil plane of the objective optical system.
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