发明名称 Semiconductor device and method of manufacturing the same
摘要 In a semiconductor device, pining regions 105 are disposed along the junction portion of a drain region 102 and a channel forming region 106 locally in a channel width direction. With this structure, because the spread of a depletion layer from a drain side is restrained by the pining regions 105, a short-channel effect can be restrained effectively. Also, because a passage through which carriers move is ensured, high mobility can be maintained.
申请公布号 US2003057501(A1) 申请公布日期 2003.03.27
申请号 US20020278441 申请日期 2002.10.22
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD., A JAPANESE CORPORATION 发明人 MIYANAGA AKIHARU;KUBO NOBUO
分类号 H01L29/78;H01L21/265;H01L21/266;H01L21/8234;H01L21/8238;H01L27/088;H01L29/10;(IPC1-7):H01L29/76 主分类号 H01L29/78
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