发明名称 Method of manufacturing trench conductor line
摘要 A method of manufacturing a trench conductor line. An etching stop layer, a dielectric layer and a polishing stop layer are sequentially formed over a substrate. The polishing stop layer and the dielectric layer are patterned to form a trench that exposes a portion of the etching stop layer. A conformal dielectric layer is formed over the polishing stop layer and the interior surface of the trench. A portion of the conformal dielectric layer is removed to expose the polishing stop layer and the etching stop layer within the trench. A conductive layer is formed over the polishing stop layer filling the trench. The conductive layer is planarized using the polishing stop layer as a polishing stop.
申请公布号 US2003060037(A1) 申请公布日期 2003.03.27
申请号 US20010967712 申请日期 2001.09.27
申请人 WU JOSEPH 发明人 WU JOSEPH
分类号 H01L21/768;(IPC1-7):H01L21/476 主分类号 H01L21/768
代理机构 代理人
主权项
地址