发明名称 Modular memory structure having adaptable redundancy circuitry
摘要 The invention provides a modular memory structure having adaptable redundancy circuitry, which can repair different types of defects using an addressing line and an enabled line, thereby increasing the yield of the memory device. The modular memory structure having adaptable redundancy circuitry includes: a plurality of main memory blocks to store data; a plurality of redundancy memory blocks to replace the defective memory blocks; a plurality of fuse sets to generate replacement signals by programming the plurality of fuse sets to replace the defect memory positions on the main memory blocks with the corresponding redundancy memory blocks.
申请公布号 US2003058714(A1) 申请公布日期 2003.03.27
申请号 US20020286889 申请日期 2002.11.04
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 CHOU JONATHAN Y.P.
分类号 G11C29/00;(IPC1-7):G11C29/00 主分类号 G11C29/00
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