发明名称 SEMICONDUCTOR DEVICE AND PRODUCTION METHOD THEREFOR
摘要 A method of producing a semiconductor device comprising the steps of forming a first−conduction−type collector layer (102) on a part of the surface of a semiconductor substrate, then forming a collector opening (110) in a first insulation layer (108) formed on the semiconductor substrate, forming by epitaxial growing a semiconductor layer (111) including a second−conduction−type layer constituting a base layer on the semiconductor substrate in this collector opening, then sequentially laminating on the semiconductor substrate an etching stopper layer (112) for dry etching and a masking layer (200) for wet etching by epitaxial growing, removing part of the masking layer by dry etching to expose part of the etching stopper layer, and wet etching the exposed portion of the etching stopper layer using the remaining masking layer as a mask to thereby form a base joining opening (114) in the etching stopper layer and the masking layer.
申请公布号 WO03026018(A1) 申请公布日期 2003.03.27
申请号 WO2002JP09569 申请日期 2002.09.18
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.;IDOTA, KEN;OHNISHI, TERUHITO;ASAI, AKIRA 发明人 IDOTA, KEN;OHNISHI, TERUHITO;ASAI, AKIRA
分类号 H01L21/331;H01L21/8249;H01L29/737;(IPC1-7):H01L29/73 主分类号 H01L21/331
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