| 摘要 |
<p>An apparatus for collecting RF signal measurement data at signal ports (1, 2) of an RF and microwave device-under-test (DUT) (3). The apparatus comprises means (6) for measuring incident and reflected RF signals at the signal ports (1, 2) of the DUT (3). Synthesizer means (10, 11,18) for generating RF signals at a fundamental frequency and higher harmonics. Tuner means (24, 25) arranged for loading the DUT (3) under different impedance conditions for the fundamental frequency and higher harmonics, and means (12 - 16, 19 - 23) for feeding the RF signals of the synthesizer means (10, 11, 18) to the signal ports (1, 2) of the DUT (3). The apparatus may form part of a Non-linear Network Measurement System (NNMS) (26), <IMAGE></p> |
