发明名称 SEMICONDUCTOR DEVICE HAVING DIELECTRIC FILM WITH HIGH PERMITTIVITY AND METHOD FOR MANUFACTURING THE SAME
摘要 PURPOSE: A semiconductor device having a dielectric film with a high permittivity and a method for manufacturing the same are provided to improve capacitance and to prevent degradation of a dielectric property due to residues of impurity. CONSTITUTION: The first gate insulating layer(22a) containing aluminum is formed on a semiconductor substrate(21). The second gate insulating layer(22b) containing lithium is formed on the first gate insulting layer(22a). A gate electrode(23) is formed on the second gate insulting layer(22b). At the time, alumina(Al2O3) is used as the first gate insulting layer(22a) containing aluminum. Also, LixTa1-xO3 (where, x=0.2-0.8) is used as the second gate insulating layer(22b) containing lithium.
申请公布号 KR20030023969(A) 申请公布日期 2003.03.26
申请号 KR20010056741 申请日期 2001.09.14
申请人 发明人
分类号 H01L27/04;C23C16/40;H01L21/02;H01L21/28;H01L21/316;H01L21/822;H01L21/8242;H01L27/108;H01L29/51;H01L29/78;(IPC1-7):H01L21/824 主分类号 H01L27/04
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