发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR
摘要 PURPOSE: To stably form a protection film at the base of a via hole and to suppress deterioration of precision in the via hole size while the generation of a sub-trench and deformation are suppressed on the surface of first wiring. CONSTITUTION: First wiring 2 is formed in a first interlayer insulating film 1. An etching stopper film 16 is formed on the first wiring 2. A second interlayer insulating film 3 and a reflection preventing film 4 are sequentially formed on the etching stopper film 16. The via hole 6 passing through the second interlayer insulating film 3 and the reflection preventing film 4 is formed so that it reaches the etching stopper film 16. An organic film 17 is formed in the via hole 6 and a trench 10 is formed to reach the organic film 17 in the second interlayer insulating film 4. The partial surface of first wiring 2 is exposed by removing the reflection preventing film 4 and the etching stopper film 16 at the base of the via hole 6. Second wiring 13 is formed in the trench 10 and the via hole 6.
申请公布号 KR20030024551(A) 申请公布日期 2003.03.26
申请号 KR20020026014 申请日期 2002.05.11
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KAWAI KENJI;NAKAJIMA YUSUKE;SHIOZAWA KENICHIRO
分类号 H01L21/302;H01L21/3065;H01L21/768;(IPC1-7):H01L21/768 主分类号 H01L21/302
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