发明名称 METHOD FOR FABRICATING CYLINDRICAL CAPACITOR OF SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: A method for fabricating a cylindrical capacitor of a semiconductor memory device is provided to prevent bit failure due to a damage of a cylindrical storage electrode by forming the cylindrical storage electrode on the second mold pattern. CONSTITUTION: The first mold pattern is formed on a semiconductor substrate(101). A protective layer is formed on an entire surface of the semiconductor substrate(101). The second mold pattern(107) is formed by etching the protective layer and the first mold pattern. A conductive layer for storage electrode is formed on the entire surface of the semiconductor substrate(101). A sacrificial layer is formed on the conductive layer in order to fill up a contact hole. A sacrificial layer pattern(111a) and a cylindrical storage electrode(109a) are formed by planarizing the sacrificial layer and the conductive layer. The sacrificial layer pattern(111a) and the second mold pattern(107) are removed.
申请公布号 KR20030024211(A) 申请公布日期 2003.03.26
申请号 KR20010057262 申请日期 2001.09.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HAM, JIN HWAN;JI, GYEONG GU;JUNG, SEUNG PIL;KANG, CHANG JIN;SON, SEUNG YONG
分类号 H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/8242
代理机构 代理人
主权项
地址