发明名称 Eye characteristic measuring apparatus
摘要 The present invention is intended to provide an eye characteristic measuring apparatus having a projection system for projecting a light source image of small amount onto a fundus of an eye by a reflected light from the fundus, and a wavefront detecting system for detecting a wavefront of luminous flux emitted from the interior of the pupil of the eye by a reflected light from the fundus, where the projection system projects a light source image of small amount onto a fundus of an eye, and the wavefront detection system detects the wavefront of luminous flux emitted from the interior of the fundus by a reflected light from the fundus, and a deflection prism having at least one transmission surface for aberration correction within both optical paths of the projecting system and the wavefront detecting system, can deflect the incident luminous flux.
申请公布号 US6536900(B2) 申请公布日期 2003.03.25
申请号 US20010819354 申请日期 2001.03.28
申请人 KABUSHIKI KAISHA TOPCON 发明人 MIHASHI TOSHIFUMI;HIROHARA YOKO
分类号 A61B3/10;A61B3/103;(IPC1-7):A61B3/10 主分类号 A61B3/10
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