发明名称 Method of making a semiconductor device with aluminum capped copper interconnect pads
摘要 A method for making a semiconductor device is described. That method includes forming a dielectric layer on a substrate, then etching a trench into the dielectric layer. After filling the trench with copper, a portion of the copper is removed to form a recessed copper plug within the dielectric layer. A capping layer that comprises aluminum is then formed on the recessed copper plug.
申请公布号 US6537913(B2) 申请公布日期 2003.03.25
申请号 US20010895522 申请日期 2001.06.29
申请人 INTEL CORPORATION 发明人 MODAK ANJANEYA
分类号 H01L21/768;(IPC1-7):H01L21/44 主分类号 H01L21/768
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