发明名称 SUBSTRATE END FACE CLEANER
摘要 PROBLEM TO BE SOLVED: To reduce the warpage of a substrate due to its own weight, to prevent the collision or the friction of a substrate against or with a cleaning nozzle. SOLUTION: The substrate end face cleaner enables the surface periphery to be cleaned while approximately a central portion of the substrate 1 is supported with a substrate vacuum chuck 2. The support position of the periphery of the chuck 2 is located in a range of 30 mm from the substrate end face to reduce the warpage of the substrate 1 due to its own weight, thereby preventing the collision or the friction of the substrate against or with a cleaning nozzle 3, etc., for cleaning the substrate periphery. This eliminates the need for stopping the operation of the cleaner for removing the substrate 1 damaged by the collision or the friction of the substrate 1 against or with the nozzle 3 or for repairing the damaged cleaning nozzle 3, and hence improves the availability factor of the cleaner.
申请公布号 JP2003086556(A) 申请公布日期 2003.03.20
申请号 JP20010279135 申请日期 2001.09.14
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 TANIGUCHI YOSHIO
分类号 B08B3/02;H01L21/304;H01L21/306;(IPC1-7):H01L21/304 主分类号 B08B3/02
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