发明名称 |
Micromachined infrared sensitive pixel and infrared imager including same |
摘要 |
An infrared (IR) sensitive pixel and an IR imager including the same. According to one embodiment, the pixel includes a substrate assembly having a cavity defined by at least one sidewall and a cantilevered beam connected to the substrate assembly and disposed in the cavity. The cantilevered beam includes a first spring portion and a first capacitor plate portion, wherein the first spring portion includes at least two materials having different coefficients of thermal expansion. The pixel further includes a second capacitor plate portion, such that incident IR radiation causes the first spring portion of the cantilevered beam to move laterally relative to the sidewall, thereby creating a variable capacitance between the first capacitor plate portion of the cantilevered beam and the second capacitor plate portion.
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申请公布号 |
US2003052271(A1) |
申请公布日期 |
2003.03.20 |
申请号 |
US20010992839 |
申请日期 |
2001.11.19 |
申请人 |
FEDDER GARY K.;LAKDAWALA HASNAIN |
发明人 |
FEDDER GARY K.;LAKDAWALA HASNAIN |
分类号 |
G01J5/34;H01L27/146;H01L31/00;(IPC1-7):H01L31/00 |
主分类号 |
G01J5/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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