| 摘要 |
The invention provides a method for testing a circuit unit (101) to be tested, in which a test time is reduced, at least one word line (102a-102N) of the circuit unit (101) to be tested being activated by application of at least one test signal (103) to the word line (102a-102N), the at least one word line (102a-102N) being deactivated by removal of the test signal (103) from the word line (102a-102N), the word lines among all the word lines (102a-102N) which have not run through an activation-deactivation cycle being read out in order to determine an influence of the activation and deactivation, and the test result being output.
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