发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a technique which can form a crystalline semiconductor film having regular orientation and having reduced impurity concentration, by controlling crystal orientations. SOLUTION: In the method for manufacturing a semiconductor device, a first semiconductor region of amorphous semiconductor is formed on an insulating surface, a crystalline semiconductor having a (100) plane orientation rate of 70% or more is formed by scanningly directing a continuous oscillation laser beam from one end of a first semiconductor region toward the other end to once melt the first semiconductor region. Thereafter, the first semiconductor region is etched to form an active layer of a TFT and to form a second semiconductor region.
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申请公布号 |
JP2003086507(A) |
申请公布日期 |
2003.03.20 |
申请号 |
JP20010274201 |
申请日期 |
2001.09.10 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI;TANAKA KOICHIRO;MIYAIRI HIDEKAZU;SHIGA AIKO;SHIMOMURA AKIHISA;HONDA TATSUYA |
分类号 |
G02F1/1368;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L21/20;G02F1/136 |
主分类号 |
G02F1/1368 |
代理机构 |
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