发明名称 CONTACT METHOD FOR THIN SILICON CARBIDE EPITAXIAL LAYER AND SEMICONDUCTOR DEVICES FORMED BY THOSE METHODS
摘要 <p>A compound semiconductor device discloses a substrate (10), active layers or compound semiconductor material layer (12, 14, 16) that are sequentially formed overt the substrate, an opening (20) in the layer (16), insulating layers (30) at side walls of the opening, a fourth compound semiconductor material (50) and reaction regions (74) within the opening, metal contacts (70) on the reaction region, and an insulating layer (80) and metal layer (72) on top of the layer (16).</p>
申请公布号 WO2003023860(A1) 申请公布日期 2003.03.20
申请号 US2002023662 申请日期 2002.07.25
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