发明名称 Dual capacitor dynamic random access memory cell
摘要 This invention discloses a dynamic random access memory (DRAM) memory cell. The DRAM memory cell includes a first transistor-capacitor circuit connected to a first bitline BL and a second transistor-capacitor circuit connected to a second bitline BL#. The memory cell further includes a gate of the first transistor connected to a gate of the second transistor. The DRAM cell further includes a sense amplifier connected to the first bit line BL and the second bit line BL# for measuring a binary bit from sensing a voltage difference between the first and second transistor-capacitor circuits independent from a pre-charged bit-line voltage.
申请公布号 US2003053330(A1) 申请公布日期 2003.03.20
申请号 US20020167383 申请日期 2002.06.10
申请人 UNIRAM TECHNOLOGY, INC. 发明人 SHAU JENG-JYE;NA BYEONG-CHEAL
分类号 G11C11/405;(IPC1-7):G11C11/24 主分类号 G11C11/405
代理机构 代理人
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