发明名称 CHARACTERISTIC INSPECTING DEVICE FOR ELECTRONIC PART
摘要 PROBLEM TO BE SOLVED: To provide a characteristic inspecting device for electronic parts, capable or relaxing impact force applied to the electronic parts. SOLUTION: This characteristic inspecting device for an electronic part p is formed by a measuring device 9 for measuring the characteristic of an electronic part p, a measurement terminal 11 electrically connected to the measuring device 9, a holding member 10 holding the measurement terminal 11, and a driving part 12 for abutting the measurement terminal 11 on the electronic part p. The measurement terminal 11 has a fitting part 11a held in the holding member 10, and a measuring part 11c abutting on the electronic part p. The driving part 12 is disposed away from the measurement terminal 11.
申请公布号 JP2003084024(A) 申请公布日期 2003.03.19
申请号 JP20020071786 申请日期 2002.03.15
申请人 MURATA MFG CO LTD 发明人 INOUE TETSUKAZU;ISHII TOSHIHIRO;KONDO DAISUKE
分类号 G01R31/26;G01R31/00;(IPC1-7):G01R31/00 主分类号 G01R31/26
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