发明名称 METHOD FOR FORMING CONTACT HOLE OF SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING THE SAME
摘要 PURPOSE: A method for forming a contact hole of a semiconductor device and a method for fabricating a semiconductor device by using the same are provided to reduce parasitic capacitance by minimizing a bridge between a wire and a contact hole. CONSTITUTION: A plurality of the first patterns(56) including the first conductive layer pattern(52) and the first insulating layer pattern(54) are formed on a semiconductor substrate(50). A plurality of spacers(58) are formed on each sidewall of thee first patterns(56). A conductive plug(60) is formed by filling a conductive material between the first patterns. The first blocking layer is formed on a surface of the conductive plug(60) and surfaces of the first patterns. The second insulating layer(64) is formed on the first blocking layer. A contact hole(68) is formed by etching the second insulating layer(64) and the first blocking layer.
申请公布号 KR20030022951(A) 申请公布日期 2003.03.19
申请号 KR20010055810 申请日期 2001.09.11
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JIN, BEOM JUN;KIM, YEONG PIL
分类号 H01L21/28;H01L21/02;H01L21/60;H01L21/768;H01L21/8242;H01L27/108;(IPC1-7):H01L21/28 主分类号 H01L21/28
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