发明名称 |
METHOD FOR FORMING CONTACT HOLE OF SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICE BY USING THE SAME |
摘要 |
PURPOSE: A method for forming a contact hole of a semiconductor device and a method for fabricating a semiconductor device by using the same are provided to reduce parasitic capacitance by minimizing a bridge between a wire and a contact hole. CONSTITUTION: A plurality of the first patterns(56) including the first conductive layer pattern(52) and the first insulating layer pattern(54) are formed on a semiconductor substrate(50). A plurality of spacers(58) are formed on each sidewall of thee first patterns(56). A conductive plug(60) is formed by filling a conductive material between the first patterns. The first blocking layer is formed on a surface of the conductive plug(60) and surfaces of the first patterns. The second insulating layer(64) is formed on the first blocking layer. A contact hole(68) is formed by etching the second insulating layer(64) and the first blocking layer. |
申请公布号 |
KR20030022951(A) |
申请公布日期 |
2003.03.19 |
申请号 |
KR20010055810 |
申请日期 |
2001.09.11 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JIN, BEOM JUN;KIM, YEONG PIL |
分类号 |
H01L21/28;H01L21/02;H01L21/60;H01L21/768;H01L21/8242;H01L27/108;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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