发明名称 Scan test apparatus using oversampling for synchronisation
摘要 <p>The invention discloses a system comprising a host, a target and connection means therebetween. The host has means for providing a clock signal, first output means for outputting said clock signal to said target via said connection means and second output means for outputting data to said target via said connection means, said data being clocked out by said clock signal, said target having first input means for receiving said clock signal from said host, second input means for receiving said data from said host and first output means for outputting data to said host via said connection means. The host further comprises input means for receiving said data from said target, and oversampling means for oversampling the received data from the target and controlling the clocking in of said data received from said target in dependence on said oversampling. &lt;IMAGE&gt;</p>
申请公布号 EP1293790(A1) 申请公布日期 2003.03.19
申请号 EP20010307925 申请日期 2001.09.18
申请人 STMICROELECTRONICS LIMITED 发明人 WARREN, ROBERT GEOFFREY
分类号 G01R31/3185;G01R31/3193;(IPC1-7):G01R31/318;G01R31/317 主分类号 G01R31/3185
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