发明名称 |
ELECTROSTATIC CHUCK OF SEMICONDUCTOR FABRICATION EQUIPMENT |
摘要 |
PURPOSE: An electrostatic chuck of semiconductor fabrication equipment is provided to exchange only a chucking plate in an exchanging process of the electrostatic chuck by improving a structure of the electrostatic chuck. CONSTITUTION: The RF power is applied to a bottom electrode(100). An electrostatic chuck body(120) is fixed to the bottom electrode(100). A positive pole electrode bar(122) and a negative pole electrode bar(124) are formed at the electrostatic chuck body(120). A chucking plate(160) has a structure which is coupled with the electrostatic chuck body(120) or decoupled from the electrostatic chuck body(120). An electrostatic chuck is formed with the electrostatic chuck body(120) and a chucking plate(140). The chucking plate(140) is connected with the electrostatic chuck body(120). A coolant flow line is formed at the electrostatic chuck body(120).
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申请公布号 |
KR20030023267(A) |
申请公布日期 |
2003.03.19 |
申请号 |
KR20010056398 |
申请日期 |
2001.09.13 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, HAE GYUN |
分类号 |
H01L21/68;(IPC1-7):H01L21/68 |
主分类号 |
H01L21/68 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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