发明名称 ELECTROSTATIC CHUCK OF SEMICONDUCTOR FABRICATION EQUIPMENT
摘要 PURPOSE: An electrostatic chuck of semiconductor fabrication equipment is provided to exchange only a chucking plate in an exchanging process of the electrostatic chuck by improving a structure of the electrostatic chuck. CONSTITUTION: The RF power is applied to a bottom electrode(100). An electrostatic chuck body(120) is fixed to the bottom electrode(100). A positive pole electrode bar(122) and a negative pole electrode bar(124) are formed at the electrostatic chuck body(120). A chucking plate(160) has a structure which is coupled with the electrostatic chuck body(120) or decoupled from the electrostatic chuck body(120). An electrostatic chuck is formed with the electrostatic chuck body(120) and a chucking plate(140). The chucking plate(140) is connected with the electrostatic chuck body(120). A coolant flow line is formed at the electrostatic chuck body(120).
申请公布号 KR20030023267(A) 申请公布日期 2003.03.19
申请号 KR20010056398 申请日期 2001.09.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, HAE GYUN
分类号 H01L21/68;(IPC1-7):H01L21/68 主分类号 H01L21/68
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