发明名称 Device for etching the backside of wafer
摘要 A device for etching the backside of a wafer is disclosed. The etching device directly feeds an etchant to a target wafer without using any medium, such as a conventional absorption fabric, thus uniformly etching the backside of the wafer, and prevents the wafer from coming into contact with the etchant during the removal of the wafer from the device, thus almost completely protecting the wafer from any damage. This etching device consists of a cylindrical housing having a conical bottom wall and an annular etching dam seated in the housing while forming an etchant collecting chamber and an etching bat An etchant supply unit is provided on the conical bottom wall of the housing. At least one first etchant discharging part communicates the etching bath with the collecting chamber, while at least one second etchant discharging part communicates the etchant collecting chamber with the outside. A target wafer is seated on the upper portion of the etching dam, and is etched at its backside by the etchant fed from the etchant supply unit into the etching bath The present invention also provides an etching system, having an etchant storage tank, a pump, and a flow controller, in addition to the etching device.
申请公布号 US6533892(B2) 申请公布日期 2003.03.18
申请号 US20010921403 申请日期 2001.08.02
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 RYU YUNG-HO;NAM HYUNG-HEE;JUNG HO-PHIL
分类号 C23F1/08;H01L21/00;H01L21/30;H01L21/306;(IPC1-7):B08B3/00;B08B7/04 主分类号 C23F1/08
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