发明名称 |
Method and apparatus for the integration of sensor data from a process tool in an advanced process control (APC) framework |
摘要 |
A method and apparatus for integrating tool sensor data in an Advanced Process Control (APC) application. A sensor receives operational state data of a processing tool related to the manufacture of a processing piece. The state data is sent from the sensor to a data server and accumulated therein. The data server processes the state data and forwards the data to an APC framework. The APC framework then forwards the state data to a fault detection unit. The fault detection unit determines if a fault condition exists with the processing tool based upon the state data. A predetermined action is performed on the processing tool in response to the presence of a fault condition. In accordance with one embodiment, the predetermined action is to shutdown the processing tool so as to prevent further production of faulty wafers.
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申请公布号 |
US6535783(B1) |
申请公布日期 |
2003.03.18 |
申请号 |
US20010799408 |
申请日期 |
2001.03.05 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
MILLER MICHAEL LEE;BUSHMAN SCOTT G. |
分类号 |
H01L21/66;(IPC1-7):G06F11/00 |
主分类号 |
H01L21/66 |
代理机构 |
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