发明名称 Continuous antifuse material in memory structure
摘要 A memory structure has an antifuse material that is unpatterned and sandwiched between each of a plurality of antifuse electrode pairs. The antifuse material is continuous between the antifuse electrode pairs. Furthermore the present invention includes a memory structure comprising a plurality of antifuse electrode pairs forming a plurality of row conductors and a plurality of middle conductors in electrical communication with a plurality of control elements.
申请公布号 US6534841(B1) 申请公布日期 2003.03.18
申请号 US20010017567 申请日期 2001.12.14
申请人 HEWLETT-PACKARD COMPANY 发明人 VAN BROCKLIN ANDREW L.;ELDREDGE KENNETH J.;WANG S. JONATHAN;PERNER FREDERICK A;FRICKE PETER
分类号 H01L21/82;H01L23/525;H01L27/10;H01L27/12;(IPC1-7):H01L29/00 主分类号 H01L21/82
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