发明名称 |
Logic gate circuit with low sub-threshold leakage current |
摘要 |
The present invention relates to a logic gate circuit capable of reducing sub-threshold leakage current by applying the reverse voltage to the gate of a turned-off MOS device. The logic gate circuit in accordance with the present invention includes a CMOS logic gate having PMOS devices and NMOS devices with a low threshold voltage, a first voltage generator applying a first reverse voltage to the PMOS device of the CMOS logic gate during a pull-down operation, and a second voltage generator outputting a second reverse voltage to the NMOS device of the CMOS logic gate during a pull-up operation. The first voltage generator outputs a voltage greater than the source voltage by the threshold voltage to the first MOS device when the second MOS device performs a pull-down operation, and the second voltage generator outputs a voltage smaller than the earth voltage by the threshold voltage when the first MOS device performs a pull-up operation.
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申请公布号 |
US6535021(B1) |
申请公布日期 |
2003.03.18 |
申请号 |
US20000630658 |
申请日期 |
2000.08.01 |
申请人 |
HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. |
发明人 |
SONG SANG HURN |
分类号 |
H03K19/017;(IPC1-7):H03K19/20;H03K19/094 |
主分类号 |
H03K19/017 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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