发明名称 Logic gate circuit with low sub-threshold leakage current
摘要 The present invention relates to a logic gate circuit capable of reducing sub-threshold leakage current by applying the reverse voltage to the gate of a turned-off MOS device. The logic gate circuit in accordance with the present invention includes a CMOS logic gate having PMOS devices and NMOS devices with a low threshold voltage, a first voltage generator applying a first reverse voltage to the PMOS device of the CMOS logic gate during a pull-down operation, and a second voltage generator outputting a second reverse voltage to the NMOS device of the CMOS logic gate during a pull-up operation. The first voltage generator outputs a voltage greater than the source voltage by the threshold voltage to the first MOS device when the second MOS device performs a pull-down operation, and the second voltage generator outputs a voltage smaller than the earth voltage by the threshold voltage when the first MOS device performs a pull-up operation.
申请公布号 US6535021(B1) 申请公布日期 2003.03.18
申请号 US20000630658 申请日期 2000.08.01
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. 发明人 SONG SANG HURN
分类号 H03K19/017;(IPC1-7):H03K19/20;H03K19/094 主分类号 H03K19/017
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