发明名称 Two pole coupling noise analysis model for submicron integrated circuit design verification
摘要 An automated method of analyzing crosstalk in a digital logic integrated circuit, the method operating on a digital computer, is described. The method uses available software to make an extracted, parameterized netlist from a layout of the integrated circuit. For at least one potential victim wire of the plurality of wires, determining a subset of the wires of the chip are found to be potential aggressor wires that may couple to the victim wire. The aggressor wires are combined into a common aggressor. A risetime of the common aggressor is calculated and used to calculate the magnitude of coupled noise on the victim wire induced by the aggressor wires. An alarm threshold for each potential victim wire is determined based upon the type of logic gate that receives the victim wire. The alarm thresholds for each potential victim wire are compared to the calculated height of a coupled noise on the victim wire to determine which, if any, wires of the design suffer enough crosstalk noise that they should be redesigned.
申请公布号 US6536022(B1) 申请公布日期 2003.03.18
申请号 US20000513545 申请日期 2000.02.25
申请人 SUN MICROSYSTEMS, INC. 发明人 AINGARAN KATHIRGAMAR;KLASS EDGARDO F.;AMIR CHAIM;KIM CHIN-MAN
分类号 G06F17/50;(IPC1-7):G06F17/50 主分类号 G06F17/50
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