| 摘要 |
A fixture is provided for use in connection with a circuit board tester. The fixture can move the unit under test (UUT), against the urging or a set of springs, to a first position in which the UUT contacts all probes of the tester, for performing a first set of tests. A partial vacuum is created in the region near the probes to permit atmospheric pressure to move the UUT to the first position. A movable or actuateable limiting member is moved to a position which can engage a fixture member in a manner such that, upon movement of the UUT in a direction away from the probes, when the vacuum is released, the amount of movement is limited, to position the UUT to contact only the taller probes. The actuator may engage any of various parts of the fixture, or a pocket found therein, including support plates or lids, or may contact a surface of the UUT.
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