发明名称 |
METHOD FOR ROUGHENING SURFACE OF SEMICONDUCTOR SUBSTRATE |
摘要 |
PURPOSE: A method for roughening the surface of a semiconductor substrate is provided to facilitate high capacitance by roughening the surface of the substrate so that the surface area of a storage capacitor is broadened to embody the storage capacitor with minimum capacitance. CONSTITUTION: The semiconductor substrate(5) having a surface(10) is arranged in a furnace. Oxygen and inert gas like argon or nitrogen are introduced into the furnace, maintaining the oxygen concentration in the furnace below 10 percent. The substrate is annealed at a temperature above 950 deg.C and mesopores(15) are formed in the surface of the semiconductor substrate. |
申请公布号 |
KR20030022689(A) |
申请公布日期 |
2003.03.17 |
申请号 |
KR20020049662 |
申请日期 |
2002.08.22 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
CAPPELLANI ANNALISA;GOLDBACH MATTHIAS |
分类号 |
H01L21/02;H01L21/306;H01L21/324;H01L21/334;H01L21/8242 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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