发明名称 METHOD FOR ROUGHENING SURFACE OF SEMICONDUCTOR SUBSTRATE
摘要 PURPOSE: A method for roughening the surface of a semiconductor substrate is provided to facilitate high capacitance by roughening the surface of the substrate so that the surface area of a storage capacitor is broadened to embody the storage capacitor with minimum capacitance. CONSTITUTION: The semiconductor substrate(5) having a surface(10) is arranged in a furnace. Oxygen and inert gas like argon or nitrogen are introduced into the furnace, maintaining the oxygen concentration in the furnace below 10 percent. The substrate is annealed at a temperature above 950 deg.C and mesopores(15) are formed in the surface of the semiconductor substrate.
申请公布号 KR20030022689(A) 申请公布日期 2003.03.17
申请号 KR20020049662 申请日期 2002.08.22
申请人 INFINEON TECHNOLOGIES AG 发明人 CAPPELLANI ANNALISA;GOLDBACH MATTHIAS
分类号 H01L21/02;H01L21/306;H01L21/324;H01L21/334;H01L21/8242 主分类号 H01L21/02
代理机构 代理人
主权项
地址