发明名称 METHOD OF PREVENTING BENDING OF SOI LAYER AND SEMICONDUCTOR DEVICE FORMED BY THE SAME
摘要 PURPOSE: A method of preventing bending of an SOI layer is provided to prevent oxygen from being diffused through an interface between the SOI layer and a buried silicon oxide layer by forming a nitrogen-containing layer on at least a part of the interface or by stacking amorphous silicon on an isolation trench and changing the amorphous silicon through a solid phase epitaxial growth method. CONSTITUTION: An SOI substrate is prepared which includes a lower silicon layer(110), the buried silicon oxide layer(111), the SOI layer and the nitrogen-containing layer between the buried silicon oxide layer and the SOI layer. The SOI layer of the SOI substrate is etched to form the isolation trench.
申请公布号 KR20030022228(A) 申请公布日期 2003.03.15
申请号 KR20030009504 申请日期 2003.02.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 AHN, DONG HO;BAE, GEUM JONG;KANG, HO GYU
分类号 H01L27/12;(IPC1-7):H01L21/76 主分类号 H01L27/12
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