发明名称 |
METHOD OF PREVENTING BENDING OF SOI LAYER AND SEMICONDUCTOR DEVICE FORMED BY THE SAME |
摘要 |
PURPOSE: A method of preventing bending of an SOI layer is provided to prevent oxygen from being diffused through an interface between the SOI layer and a buried silicon oxide layer by forming a nitrogen-containing layer on at least a part of the interface or by stacking amorphous silicon on an isolation trench and changing the amorphous silicon through a solid phase epitaxial growth method. CONSTITUTION: An SOI substrate is prepared which includes a lower silicon layer(110), the buried silicon oxide layer(111), the SOI layer and the nitrogen-containing layer between the buried silicon oxide layer and the SOI layer. The SOI layer of the SOI substrate is etched to form the isolation trench.
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申请公布号 |
KR20030022228(A) |
申请公布日期 |
2003.03.15 |
申请号 |
KR20030009504 |
申请日期 |
2003.02.14 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
AHN, DONG HO;BAE, GEUM JONG;KANG, HO GYU |
分类号 |
H01L27/12;(IPC1-7):H01L21/76 |
主分类号 |
H01L27/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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