发明名称 NONVOLATILE SEMICONDUCTOR MEMORY
摘要 <p>PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor memory in which while data rewriting can be electrically performed, memory size can be reduced, and manufacturing cost can be reduced. SOLUTION: The nonvolatile semiconductor memory is provided with a plurality of cell transistors CT11, CT12,..., a plurality of transistors for selection ST1, ST2,..., row lines, column lines, a first decoder 37 and a second decoder 39. The transistor for selection selects (n) pieces (n>=2) of the same column out of the plurality of cell transistors. Control gate lines of cell transistors of the same row out of a plurality of cell transistors are connected respectively to the row lines. The transistors for selection are connected to the column lines. The first decoder supplies decode-signals W11, W12,... to each control gate of cell transistors of the same row via the row lines. The second decoder supplies decode-signals X1, X2,... to the transistors for selection, and selectively controls conduction.</p>
申请公布号 JP2003077287(A) 申请公布日期 2003.03.14
申请号 JP20020183524 申请日期 2002.06.24
申请人 TOSHIBA CORP 发明人 IWAHASHI HIROSHI
分类号 G11C16/06;G11C16/04;H01L21/8247;H01L27/10;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C16/06;H01L21/824 主分类号 G11C16/06
代理机构 代理人
主权项
地址