| 摘要 |
PROBLEM TO BE SOLVED: To overcome problems wherein terminals for test are increased or generating method of data for test becomes complicated and control speed in the case of the test is lowered by increase of transfer quantity of test data when a plurality of semiconductor cores 4, 5 individually having test circuits are integrated into one semiconductor device. SOLUTION: An instruction code is transferred to the semiconductor core 4 specified by referring to an additional bit that specifies the semiconductor core added to the instruction code as it is and the instruction code is transferred to the semiconductor core 5 which is not specified by replacing the instruction code with the one which does not effect an operation of the semiconductor core 5 in a data converting part 28. Thus, only the specified semiconductor core 4 can be controlled. |
