发明名称 |
PHOTORESIST APPLICATION METHOD AND APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a photoresist application method. SOLUTION: The photoresist application method includes a stage for jetting a solvent against a wafer W, a stage for jetting photoresist against the wafer W, and a stage for rotating the wafer at a fixed speed in this order. The solvent is jetted against the surface of the wafer W before the photoresist is jetted, thus reducing the surface tension and the viscosity of resist, and hence uniformly applying the photoresist that is an organic solvent onto the surface of the wafer W. |
申请公布号 |
JP2003077829(A) |
申请公布日期 |
2003.03.14 |
申请号 |
JP20020187350 |
申请日期 |
2002.06.27 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
KIM SUNG-IL;BOKU SEIGEN;SONG JAE-KWAN;CHA DONG-HO;LEE YOON-KEUN;PARK YOUNG-HO;AN KYUNG-SUK;OH YOUNG-SU |
分类号 |
G03F7/16;B05C11/08;B05D1/40;G03F7/30;H01L21/00;H01L21/027;H01L21/302;H01L21/312;H01L21/461 |
主分类号 |
G03F7/16 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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